2020年7月30日布鲁克推出了ZUI新一代超高速原子力显微镜NanoRacer®。NanoRacer®凭借其50帧/秒的超高速成像，实现了真正意义上视频级成像速度下单个生物分子的动态观察。NanoRacer®的革新性的技术突破，在AFM发展史上树立了新的里程碑。布鲁克BioAFM研发团队与生命科学领域的专家紧密合作，使NanoRacer®不仅拥有超高扫描速率与原子级别分辨率，而且拥有杰出的易用性，使得对单分子动态过程的捕捉变得十分便捷，为深入理解生物物理、生物化学、分子生物学、病毒学以及生物医学等领域的单分子动态过程提供了强大工具。

全新的NanoRacer®采用了新的架构结合更低噪音、更高稳定性的Vortis™ 2控制器，全新的驱动算法与力控制算法，可以在超高速下获取高分辨的生物样品信息。新系统整合了基于工作流程的V7操作软件，直观的用户界面与流程化、自动化的设置使得研究人员可以专注于自己的实验，加速高端研究的产出能效。

Specifications

Maximum scan speed of up to  50 frames/sec with 100 ×100 nm2 scan range and 10 k pixels

• Atomic defect resolution in  closed-loop

• Designed for medium to small sized cantilevers for lowest forces and highest scan speeds

• Ultra-low noise cantilever-deflection detection system

• IR cantilever-deflection detection light  source with small spot size

• Optional photothermal cantilever drive. 730 nm wavelength ensures minimal sample interaction compared to blue-light excitation

• Highest detector bandwidth of  8 MHz for high speed signal capture

• Automated laser and detector   alignment

• Scanner unit

• 2 × 2 × 1.5 μm3 scan range

• Sensor noise level < 0.09 nm RMS in xy

• 0.04 nm RMS sensor noise level in z

• Highest resonance frequency for z axis of >180 kHz

• Typical sample size 4 mm diameter

Control electronics

• Vortis 2 Speed controller: State-of-the-art, digital controller  with lowest noise levels and  highest flexibility

• Newly designed, high-voltage power amplifier drives the scanner unit

New workflow-based V7 SPMControl software

• True multi-user platform, ideal for imaging facilities

• User-programmable software

• AutoAlignment and setup

• Advanced feedback algorithms

• Fully automated sensitivity and spring constant calibration using thermal noise or Sader method

• Improved ForceWatch™ and  TipSaver™ mode for force spectroscopy and imaging

• Advanced spectroscopy modes, e.g. various force clamp modes or ramp designs

• Powerful Data Processing (DP) with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.

• Powerful batch processing of force curves and images, including WLC, FJC, step-fitting, JKR, DMT model and other analyses